Assembly aid for mounting packaged integrated circuit devices to printed circuit boards

ABSTRACT

An apparatus and method for surface-mounting ball grid array integrated circuit (IC) devices to printed circuit boards. A thin single- or multi-layer sheet of nonconductive material having a plurality of apertures corresponding to the leads of the IC device to be mounted is interposed between the ball grid array and the circuit board prior to solder processing to facilitate solder application, device alignment, and solder retention. An assembly guide is located on the top surface of the aid to assist in the orientation and placement of the IC device during assembly. In a further aspect, the disclosed assembly aid helps compensate for non-planarity in the IC device array or circuit board, and maintains a minimum standoff distance between the IC package and the circuit board to preclude undue solder joint deformation. The assembly aid also allows for reworking of the surface mount by facilitating localized placement of the solder prior to reflow processing without masking or other additional processing steps.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention is related to the field of integrated circuits andsurface mount technology. More specifically, the present invention isdirected to an assembly aid for facilitating the surface-mounting ofball grid array (BGA) integrated circuit (IC) devices to printed circuitboards (PCBs), chip carriers, or similar components using reflow soldermethods.

2. Description of Related Technology

Surface mount technology (SMT) is increasingly being employed as acost-effective means of mounting IC devices to printed circuit boards.Numerous different techniques for mounting integrated circuit devices tocircuit boards, chip carriers, or other components fall within thegeneral category of SMT. Of these techniques, area array (as opposed toperimeter array) technology is often used to mount high I/O densitypackages with a great degree of reliability and manufacturingefficiency. Area array techniques include the use of pin grid arrays(PGAs), column grid arrays (CGAs), and ball grid arrays (BGAs). The morerecent BGA and CGA techniques provide substantial improvements over PGAmethods in that higher densities, reliability, and efficiency can beobtained for many types of packages.

As the name implies, ball grid arrays (BGAs) utilize a grid or array ofelectrical terminals, such as solder bumps or balls arranged on one sideof the IC package to effectuate electrical contact with the circuitboard. The solder bumps of the array may vary in material, size (heightand width) and pitch (i.e., bump-to-bump spacing) based on theindividual package. Standard bump heights may range from less than oneto several millimeters. Standard pitches in common use are 1.00, 1.27,and 1.50 mm (PBGA and CBGA) and 0.5 mm (MBGA). Additionally, the solderbumps may be arranged in a uniform or non-uniform array pattern, withsome leads removed in certain areas, which is referred to as"depopulation," depending on the desired attributes of the package.Solder bumps or balls are typically attached to the board or moduleusing a eutectic solder with a lower melting point than that of thesolder balls of the array, thereby allowing removal and rework withoutdamage to the components.

The preferred substrate attachment site or land pattern geometry for usein BGA packages is usually circular or rectangular with the dimensionsadjusted to meet ball size and pitch requirements. The lands or pads mayalso be recessed into the circuit board. A large number of differentattachment schemes and pad geometries have been devised for use in suchapplications, the properties of which are well understood in the surfacemount field.

Common BGA package configurations include ceramic (CBGA) and plastic(PBGA), as well as micro-BGA (MBGA). Each of these types of packages hasits own attributes, which are also well understood in the field of SMT.Package outline specifications are presented in industry standards suchas the joint industry council JEDEC Publication 1995. In addition toindividual IC devices, multi-chip modules or chip carriers can also beeffectively surface mounted using area array techniques.

FIG. 1 depicts a typical prior art surface mount of a BGA IC device 200on a printed circuit board 202, showing the solder joints 203 formedbetween the terminals 311 of the BGA and the PCB lands 220.

BGA packages are typically mounted to the desired substrate or componentusing reflow solder processing techniques. Reflow soldering processesgenerally use forced convection heating (air or nitrogen) to melt andreflow solder beads or paste interposed between the surfaces to bejoined. A paste, ball or other form of solder such as Pb/Sn, Pb/Sn/Ag orsimilar composition, depending on the desired attributes, is set betweenthe BGA ball leads and the etched land or pad of the PCB or chip carrierand exposed to a temperature profile which results in reflow of thesolder. Surface tension created in the resulting solder liquid massduring reflow tends to prevent collapse of the solder, causing the jointto eventually solidify in a barrel or truncated sphere shape that iscommonly referred to as a Controlled Collapse Chip Connection, or "C-4".Numerous variations on this general theme exist, including the use oftwo or more different solders with various melting points to producereflow of various portions of the joint during different processes, orto allow rework.

In one type of reflow process, pre-tinned leads of an IC device areattached to a substrate etched to receive these leads. A solder pastestencil having apertures that are the same or nearly the same size asthe etched pads (lands) on the PCB is aligned on the substrate; solderpaste is applied to the unmasked areas, and the stencil is subsequentlyremoved. The IC device is then placed such that the leads contact thepaste on the etched pads, and the entire assembly is passed through areflow processing oven which applies a predetermined time/temperatureprofile to the solder paste and tinning to liquify these substances andform a solder joint between the lead and the substrate pad.

Land areas may be determined by solder masking, etching, or othermethods. In the commonly used technique of solder masking depicted inFIG. 2, the paste 300 may be applied through a solder mask 205 which islater removed so that the solder matches the shape and size of the pad220 ("mask free"), or with somewhat more restricted dimensions so thatthe paste 300 does not cover the entire area of the pad ("maskdefined"). Mask-free patterns tend to promote a uniform tapered columnprofile, while the mask-defined areas tend to promote controlledcollapse (C-4) profiles during reflow. As shown in FIG. 2, thedeposition of solder paste on the circuit board land pad 220 is notalways uniform or conducive to proper alignment of the ball terminalwith respect to the land.

In addition to the reflow method described above, IC devices may also besurface mounted using deposition of solid solder elements. In thisprocess, the solidified solder elements are placed in position on thesubstrate pads, with the small amount of solder flux resident on theelement used to adhere the element to the substrate. The IC device isthen placed with its terminals in contact with the solder elements, andthe assembly is exposed to an appropriate reflow time-temperatureprofile to form the solder joints. This method has the advantage ofobviating the masking and solder paste application process describedabove; however, it requires the precise placement of the solid solderelements in relation to the pads and, ultimately, the IC device leads.

Various methods of applying and forming solder paste or solidifiedelements on the substrate have been devised. For example, U.S. Pat. No.5,403,671 discloses a method of forming desirable solder shapes onindividual contact pads of the PCB using a permanent mask and wire meshcompressed onto the solder during heating. This approach has thedrawbacks of requiring the use and placement of the mask and wire mesh,as well as requiring extra processing steps related to the heating andcompression of the assembly.

U.S. Pat. No. 5,051,339 discloses a method by which a PCB is masked andlaminated with a temporary photoimageable layer prior to immersion in apool of molten solder. A closure element is used following the immersionto flatten the solder into the pad areas during cooling, thereby formingsolder "pillars" in the unmasked pad regions. This technique suffersfrom several drawbacks, including the difficulty of stripping thetemporary layer from the substrate after pillar formation, and thephysical instability of the pillars during component mating.Additionally, the technique does not lend itself to component rework,particularly when other components (i.e., other than the component beingreworked) may already be mounted to the circuit board.

U.S. Pat. No. 5,442,852 discloses a method of fabricating a high densityarray of solder balls by perforating a thin sheet of dielectric materialto create a aperture grid or array. The dielectric sheet is than matedto the substrate, with the lands or pads coinciding with the apertures.Spherical solder balls are placed in each of the apertures, and theassembly is then heated such that the balls reflow into the aperturesand bond to the pads on the substrate. A substantially spherical portionof the ball remains above the aperture due to the effects of surfacetension. The resulting ball/substrate array can then be used to mate thesubstrate to another substrate. This invention does not provide forfacilitating the mounting of an IC device have a preexisting terminalarray to a substrate, but rather is designed for forming of the terminal(ball grid) array itself. Additionally, no means of alignment of thesheet with relation to the PCB or IC device is provided.

IC devices and PCBs may have some degree of non-planarity or "warpage"as a result of the manufacturing process and/or storage prior to surfacemounting. CBGA packages are generally less susceptible to warping of thepackage itself as compared to PBGA packages; however, PBGA packagesoffer inherent advantages in terms of manufacturing cost, making theiruse desirable in many applications. Additionally, the printed circuitboard and/or IC device may undergo some degree of warpage due tomechanical stresses resulting from thermal expansion during heatup,cooldown, or normal operation. As the components warp, varying degreesof stress may be placed on the solder joints of the BGA. In extremecases, such stresses may result in the failure of one or more solderjoints, or more typically, failure to form one or more joints duringreflow processing.

One method of compensating for such warpage is disclosed in U.S. Pat.No. 5,435,482 which teaches planarizing the ball grid terminal arrayassociated with BGA devices such as PBGAs, which are susceptible towarpage during manufacture and processing. This patent discloses the useof a number of solder balls of different shapes and diameters which arethen planarized by pressing the substrate to which the balls areattached to a platen, which may be heated to deform the solder balls asnecessary to make uniform contact with the platen. This process ineffect provides a more planar BGA package, and is completed prior topositioning and reflow processing. However, the process requiresspecialized equipment, such as a vacuum chuck for holding the packages,specialized processes for the manufacture and use of non-uniform solderballs, and at least one extra processing step prior to reflow.

During the reflow soldering process, the alignment of the IC device iscritical to the acceptability and longevity of the solder joints betweenthe components to be joined. Furthermore, if excessive normal force isapplied, the quality of the resulting reflow solder joints may beaffected, producing a condition referred to as "squashing". Aspreviously discussed, surface tension of the liquid solder produces aresilient force and helps maintain the integrity of the joint. If thenormal force is excessive, one or more joints may collapse therebyresulting in unwanted wetting of adjacent features, solder shorts,balls, or other undesirable side-effects. See "A Model for Deformationof Solder Bumps From Ramp Loading" by L. Goldmann, Journal of ElectronicPackaging, March 1996. incorporated herein by reference. Similarly, ifthe device is pitched at an angle to the board during reflow processing,the joints on a portion of the array may collapse, whereas those onother portions of the array may not form.

BGA devices used in surface mount applications can be somewhat selfcentering; see for example "Determination of Optimal Solder Volume forPrecision Self-Alignment of BGA Using Flip Chip Bonding" by P. Nasiatkaand Z. Karim, Proceedings of the 1995 IEEE Hong Kong Electron DevicesMeeting. This property results from a number of factors including thesurface tension generated during reflow, and lateral forces generated bythe array leads or balls fitting into the terminal pads, which oftenhave a somewhat concave or hemispherical shape to receive the leads.However, due to other factors such as misalignment during placement,equipment vibration, variations in solder ball volume and dimensions,thermal gradients, and human error, the device being mounted is oftennot in the desired alignment when reflow processing is begun, and suchself-centering forces are insufficient to cause realignment.Furthermore, some processes such as solder masking may produce solderpaste shapes which are amenable to easy positioning prior to reflow,thereby potentially reducing surface tension restoring forces.

Based on the comparatively small pitches in use with presently existingBGA/MBGA packages, slight misalignment of the device during reflowprocessing can result in joint defects including voids, solder shorts,or even failure to form a joint. Such defects can produce highelectrical resistance or shorts, as well as reduced component or jointlongevity, thereby ultimately requiring rework of the component. Properalignment during reflow processing is therefore critical to highmanufacturing efficiency.

Rework processing is another consideration when using BGA devices in SMTapplications. If the numerous joints of the BGA package do not formproperly during the initial reflow process, the package must be removedand remounted to the PCB. When other devices are already mounted to theboard, remasking, pasting, and resoldering using existing SMTmethodologies is often impractical or unfeasible. In some suchsituations, the BGA package is removed from the board and the board isdiscarded rather than reworked, thereby contributing to increasedmanufacturing cost and processing time.

A similar consideration relates to BGA package mounting and reworkingduring PCB design. During the design phase, the layout of many circuitboards (i.e., the placement of components on the board) is often notwell established and subject to frequent change. Relocation of a givenBGA package is potentially problematic using existing technology for thereasons described above. Note that BGA packages do not lend themselvesto the use of sockets and receptacles, thereby making surface mountingof the package a virtual necessity. Hence, "prototyping" of circuitboards using BGA packages would be substantially simplified if thepackage(s) could be readily removed and remounted without the need torework the entire board.

Based on the foregoing, it would be most desirable to provide animproved apparatus and method for mounting one or more integratedcircuit devices on a printed circuit board or other component whichwould overcome the limitations of existing surface mount and reflowsoldering technology by improving the efficiency and reliability withwhich such assemblies could be manufactured while also facilitatingrework and prototyping. Such an improved method would i) provide formore rapid and accurate orientation and placement of the IC device withrespect to the substrate prior to reflow soldering; ii) reduce thenumber and/or complexity of processing steps necessary to prepare theassembly for reflow processing; iii) facilitate maintaining properrelative alignment of the package and substrate during actual reflowprocessing to enhance joint formation; and iv) permit easy rework of oneor more IC devices mounted in proximity to other devices.

SUMMARY OF THE INVENTION

The present invention satisfies the aforementioned needs by providing animproved apparatus for surface mounting BGA IC packages to printedcircuit boards. A cost effective and simplified method for mounting theBGA device to the PCB is also disclosed.

In a first aspect of the invention, an assembly aid for surface mountingball grid array packaged integrated circuit devices to printed circuitboards or other similar components is provided. The assembly aid iscomposed of one or more thin, electrically nonconductive and partiallycompressive sheets which include apertures extending through theirthickness and corresponding to the ball lead terminals of the ball gridarray, as well as having a visual assembly guide on its top surface. Theaid provides a means for retaining and aligning solder paste orindividual solidified solder elements with respect to the terminals of aball grid array and the substrate such that the IC device may be morerapidly and accurately oriented and positioned, and electrical contactbetween the terminals of the array and the circuit board may beestablished via reflow soldering. One embodiment of the assembly aidalso helps compensate for minor warpage or non-planarity of the packageand/or circuit board in the region of the surface mount by allowing forjoints of varying dimensions between the individual array solder ballsand their respective PCB land areas. This is made possible by thesomewhat viscous state of the unprocessed solder paste and/or theflexibility/compressibility of the assembly aid sheet material. Theassembly aid also helps to mitigate "squashing" or loading of the ICdevice during soldering by maintaining a minimum standoff distancebetween each individual substrate land and its corresponding BGA lead.

In a second aspect of the invention, an improved method of mounting BGAIC devices to a printed circuit board using the aforementioned assemblyaid is disclosed. The assembly aid is placed on or bonded to the printedcircuit board in the desired orientation, and the BGA packaged device issubsequently aligned over the assembly aid, at which point the entireassembly (IC device, assembly aid, and PCB) is heated to the appropriatetemperature for a prescribed time to initiate reflow of the solder pasteor elements positioned in the assembly aid. This method permits morerapid and accurate placement, alignment, and reflow soldering of the BGAdevice than existing prior art methods, without the need for masking orother similar techniques. Also disclosed are improved computer circuitboards having a BGA packaged IC device mounted using the assembly aidand method described above.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective view of a prior art printed circuit boardassembly having a ball grid array integrated circuit device and maskedsubstrate.

FIG. 2 is a cross-sectional illustration of the prior art printedcircuit board assembly, taken along line 2--2 of FIG. 1.

FIG. 3 is cross-sectional illustration of a first preferred embodimentof the ball grid array assembly aid of the present invention,incorporating a plurality of solidified eutectic solder elements.

FIG. 4 is a cross-sectional illustration of a second preferredembodiment of the ball grid array assembly aid of the present invention,incorporating a eutectic solder paste.

FIG. 5 is an exploded perspective illustration of a first preferredembodiment of the assembly aid, BGA packaged IC device, and printedcircuit board.

FIG. 6a is a cross-sectional view of the first embodiment of the presentinvention and a BGA IC device, taken along line 6--6 of FIG. 5 andillustrating IC device non-planarity and compensation therefor by theassembly aid.

FIG. 6b is a cross-sectional view of a second embodiment of the presentinvention and a BGA IC device, taken along lines similar to those ofFIG. 6a and illustrating IC device non-planarity and compensationtherefor by the assembly aid.

FIGS. 7a through 7d comprise a process diagram illustrating onepreferred method of mounting a IC BGA device on a circuit board.

FIG. 8 is a graphical representation of a typical reflow solder processtime-temperature profile used in conjunction with the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

Reference is now made to the drawings wherein like numerals refer tolike parts throughout.

A first preferred embodiment of the assembly aid is shown in FIG. 3. Theassembly aid 100 is composed of one or more substrates 101, 102fabricated from a nonconductive and flexible dielectric material such ascardstock, Kapton™ (polyimide), low-density polyethylene, or elastomerof sufficient temperature resistance. In the case of multiplesubstrates, the individual layers 101, 102 are bonded together to form asingle assembly. A plurality of apertures 107 are cut or formed in thesecond substrate layer 102 to receive solder. A layer of material 104 ofsimilar composition to that of the substrates previously describedhaving an adhesive surface 106, and apertures 108 of somewhat smallerdiameter than those of the second substrate 102, is overlayed over thesubstrate(s) 101, 102 such that the apertures in the layer 104 andsubstrates 101, 102 are coincident, and a plurality of recesses 112 areformed. During assembly, the layer 104 captures a plurality of solderelements 110 within the recesses 112 formed in the substrate 102 toreceive these elements. This layer of material 104 may be of solid formwith its apertures stamped or cut out, or alternatively may be anadhesive coating sprayed onto the substrate 102 before or after thesolder elements 110 are positioned. Alternatively, rosin flux-coatedsolder elements 110 may be used such that the adhesive property of theflux (i.e., "tackiness") maintains the position of the elements withintheir recesses 112 without resorting to use of the adhesive layer 104.

During mounting, the assembly aid 100 of FIG. 3 is interposed between acircuit board 202 and an IC device 200 such that the apertures 108 inthe assembly aid align with their respective terminals of a BGA 311, theholes or depressions 116 in the individual solder elements, and the PCBlands 220. The assembly aid 100 is bonded to the circuit board 202 usingany number of commercially available adhesives 209 or processes suitablefor such applications. The aforementioned solder element recesses 112 inthe upper surface of the assembly aid substrate 102 may be of a depthrepresented by arrows 208 sufficient to preserve a clearance indicatedby arrows 214 between the bottom surface 210 of the IC package 220 andthe top surface of the adhesive layer 104 of the assembly aid when thepackage is mounted, thereby facilitating air circulation around thepackage. Alternatively, the depth represented by arrows 208 may beadjusted so that contact is maintained between the bottom of the ICpackage 210 and top of the adhesive layer 104 when mounted, therebyfacilitating direct conduction of heat into the assembly aid 100 andultimately into the underlying circuit board.

The preferred shape for the solidified solder elements 110 included inthe first embodiment of the assembly aid of FIG. 3 is toroidal ("donut"shaped), and being sized in relation to the apertures through the aidsubstrate 108 such that the elements 110 will not fall through theapertures during assembly/processing. Other solder element shapes may beused, including square, rectangular, or polygonal blocks. Note also thata hole through each element 116 is not essential; a depression orconcavity in the element will also meet the object of maintaininglateral alignment of the BGA during placement and subsequent reflowprocessing. In the case of solder paste, the paste will maintainsufficient deformability such that the leads of the device will bereceived by the paste when the device is mated to the assembly aid priorto reflow.

FIG. 4 shows a second embodiment of the present invention, in which theapertures 107 in the assembly aid substrate 102 are filled with aeutectic solder paste compound 300 prior to reflow soldering, thecomposition and properties of which are well understood in the art. Theuse of solder paste obviates the need for the aforementioned solidsolder elements and adhesive retaining layer. The solder paste may bemade concave as illustrated at 302 or otherwise deformed during ICdevice placement so as to receive the ball terminals 311 on the bottomside of the BGA package 210 when assembled. Additionally, the use ofsolder paste 300 helps compensate for minor non-planarity of the ICpackage and/or PCB 202 in that the individual BGA leads 311 can bereceived to varying depths such as indicated by arrows 304 within theirrespective solder paste elements without compression of the assembly aidsubstrate 102.

The assembly aid is sized and the apertures cut according to the type,size, and lead configuration of the device(s) being mounted. It can beappreciated that a large variety of different array configurations,package designs, ball pitches, and component functions can beaccommodated by the features of the present invention. In the preferredembodiments of FIGS. 3 and 4, the apertures 108 are circular in crosssection, corresponding to the preferred toroidal solder elements and/orthe circular cross-section of the BGA terminals. These apertures 108traverse the entire thickness of the substrate, although it can beappreciated that other shapes may be used successfully based on ICterminal and PCB land geometries in use. A recess of larger diameter maybe cut partway into the top surface of the assembly aid 100 so as toreceive the solidified solder elements or paste. The assembly aid 100may also be formed by bonding two or more layers of substrate material101, 102 together, the apertures in which are of different diameters soas to receive the solder elements or paste on the upper surface, asdepicted in FIGS. 3 and 4. Alternatively, the apertures may be taperedto accomplish the desired function.

The preferred material for the solder elements 110 or solder paste 300is a metal eutectic with melting point below that of the terminal leadson the BGA, or of any solder joining the solder balls of the grid to thepackage vias 118. Common eutectic solders suitable for this applicationinclude 63% Sn/37% Pb, 62% Sn/36% Pb/2% Ag, and 62% Sn/36% Pb/2% In, allwith a melting point of roughly 180 degrees Celsius. It can beappreciated, however, that other solder compositions with differentmelting points may be used in this application.

Referring now to FIG. 5, it is seen that in the preferred embodiments,an alignment or assembly guide 120 is printed or attached to the upperface of the substrate 102 or adhesive layer 104 to facilitate aligningthe device. This guide 120 is useful not only in determining the lateral(i.e., x-y) placement of the IC device prior to soldering, but also theorientation of the device, insuring the device is not rotated 90 or 180degrees from the desired orientation. Furthermore, the guide 120 can beused in aligning the assembly aid with respect to the circuit board 202prior to or coincident with IC placement. In one embodiment, the guide120 includes a series of alignment reference marks 124 printed directlyon the upper face of the assembly aid 100 using conventional printingtechniques. It can be appreciated that a number of different styles,configurations and colors of mark may be used without departing from thespirit of the present invention.

When the BGA IC device 200 is placed on top of the assembly aid 100 asshown in FIGS. 3 and 4, the solder bumps 311 of the grid are readilyaligned with the apertures or depressions in the solder elements 110 orpaste 300 and those in the substrate 102 such that during processing,the solidified or paste solder elements will reflow within the aperturesof the assembly aid substrate and form an electrical contact between theBGA terminals 311 and the land areas on the printed circuit board 220.As was previously noted, this is accomplished by choosing paste orsolder elements having a melting point or liquidus temperature lowerthan that of the solder balls of the array. After exposure to the reflowprocess, the ball terminals of the BGA 311 are left generally intactsuch that subsequent reworking of the surface mount may be performed.Note also that if some non-zero clearance is maintained between thebottom of the IC package and the top surface of the assembly aid aspreviously described, flow of the hot gas around the individual solderelements during reflow processing is not inhibited, thereby mitigatingthe creation of substantial non-uniformities in temperature across thearray terminals.

The overall thickness of the assembly aid, including the substrates 101,102 and any adhesive or other layers communicating therewith, isdetermined by the individual IC package type and terminal design in use,but will typically be on the order of 0.05 in. (1.27 mm) for BGApackages. Compressibility of this material is not essential, but in thecase of the first embodiment described above, compressibility aids incompensating for instances of undesired minor non-planarity of the BGAIC device 200 and/or the PCB 202 in that region, as shown in FIG. 6a. InFIG. 6a, the non-planarity of the IC device 200 (exaggerated for clearerillustration) results in penetration of the balls of the array 311 tovarying depths in the solder element recesses 112. Hence, compression ofthe portions of the assembly aid substrate 101, 102 at either end of theIC device including the region immediately supporting the solderelements 130, is necessary to permit contact between the balls of thearray 311 and the solder elements 110. A non-resilient (i.e., highcompression set) material such as cardstock is preferred to preventupward forces on the solder joints after compression/reflow processing.If a compressible material is used, a minimum compressed thickness 206corresponding to the desired minimum height of the solder joints is alsodesirable.

FIG. 6b shows the effects of IC device non-planarity on a secondpreferred embodiment of the assembly aid. As previously described, thisembodiment uses a deformable solder paste in place of the solidifiedsolder elements in the recesses 112. This obviates the need forcompression of the substrate layers 101, 102 since the individual ballsof the array 311 are free to penetrate to varying depths in theirrespective recesses 112 while still maintaining adequate contact withthe solder paste. Hence, some degree of non-planarity of the ball gridarray can be accommodated since the solder paste 300 in each recess 112will deform to the necessary depth required to receive the respectiveBGA terminal ball 311. As shown in the particular example of FIG. 6b,the BGA balls in the center of the IC device 200 will require lesspenetration and deformation of the solder paste as compared to those ateither end of the IC device.

It is apparent that each of the above identified embodiments havelimitations regarding the degree of IC device non-planarity which can beaccommodated while still maintaining adequate array ball-to-soldercontact. Generally, however, non-planarities present in modern BGA ICpackages are low (on the order of 0.001 in. or less) such that they maybe compensated for by either embodiment of the present invention. It canbe appreciated that other types of non-planarities (such as the inverseof that shown in FIGS. 6a and 6b, or torsional distortion), and minornon-planarities in the circuit board itself may also be compensated forin similar fashion by the present invention.

Referring now to FIGS. 7a through 7d, in a first preferred method ofmounting a BGA IC device 200 to a circuit board 202, the pre-assembledassembly aid 100, including the solder elements 110 and overlaidadhesive layer 104, or alternatively the solder paste 300, is positionedwith respect to the circuit board using the alignment guide 120previously described, as shown in FIG. 7a. The assembly aid is thenbonded to the circuit board 202 using an adhesive 130 or othercomparable means as shown in FIG. 7b. The adhesive 130 may be applied tothe bottom of the assembly aid 100, or to the circuit board itself TheIC device 200 is then positioned according to the alignment guide 120atop the assembly aid 100, with the ball grid array solder bumps 311aligned with the solid or paste solder elements captured in the uppersurface of the assembly aid substrate 102 (FIG. 7c). Appropriate normalforce is applied to properly seat the device and to compress thesubstrate if desired, and a predetermined reflow processing heatingprofile such as that set forth in FIG. 8 and described below is thenused to melt the solder elements 110 or paste 300 and form theelectrical joints between the ball grid array and PCB lands (FIG. 7d).Conventional reflow processing methods may be utilized, therebyobviating the need for any specialized equipment. The reflow processconditions suitable for use with the present invention will vary as afunction of numerous factors including the type of IC package, substrateand adhesive layer material chosen, type and composition of solder, andtype of circuit board to which the IC is being mounted.

In a second method, the assembly aid is bonded to the PCB, and thesolder paste or elements is/are applied to the assembly aid afterwards.Alternatively, in a third method, the solder paste or solid elements areplaced in the apertures of the assembly aid which is then mated to theIC device prior to being bonded to the PCB as a unit and subsequentlyreflow soldered. It is apparent that various permutations of the basicprocess described above may be used depending on the attributes desiredby the user.

FIG. 8 is a graphical representation of a typical reflow solder processtime-temperature profile used in conjunction with the present invention.As shown in the Figure, varying temperatures are applied to thecomponents being reflow soldered for varying intervals in order toeffect controlled reflow of the solder elements or paste. A number ofdifferent considerations which are presently well understood in the art(including, without limitation, the composition of solder being used,the type of reflow processing equipment, and the types of IC devicesbeing mounted) determine the specific time and temperature parameters ofthe profile used with a given application; it can therefore beappreciated that a large number of different profiles may be usedsuccessfully with the various embodiments of the present invention.

While the above detailed description has shown, described, and pointedout the fundamental novel features of the invention as applied tovarious embodiments, it will be understood that various omissions,substitutions, and changes in the form and details of the device andprocesses illustrated may be made by those skilled in the art withoutdeparting from the spirit of the invention.

What is claimed is:
 1. An assembly aid for mounting an integratedcircuit device having connecting leads to a circuit board, comprising:aplurality of solidified eutectic solder elements, said elements beingshaped to receive respective ones of said connecting leads; a mountingsubstrate having a first surface, a second surface, and a plurality ofapertures corresponding to the location of said connecting leads, saidapertures having recesses on said first surface sized to receive andretain said solidified eutectic solder elements within said mountingsubstrate; and an adhesive layer having a plurality of aperturescorresponding to the location of said connecting leads, said adhesivelayer further retaining said solder elements within said mountingsubstrate recesses, said apertures in said adhesive layer communicatingwith said solidified solder elements.
 2. The assembly aid of claim 1,wherein said solidified solder elements have holes through theirthickness to receive said connecting leads.
 3. The assembly aid of claim1, wherein said solidified solder elements are selected from the groupof shapes consisting of a toroid, a cylinder, a square block, arectangular block, or a polygonal block.
 4. The assembly aid of claim 1,wherein said solidified solder elements include a flux coating.
 5. Theassembly aid of claim 1, wherein said mounting substrate is composed oftwo layers, each of said layers having apertures of different diametercommunicating with the apertures of the other layer.
 6. The assembly aidof claim 1, wherein the integrated circuit device comprises a ball gridarray.
 7. The assembly aid of claim 1, wherein the cross-section of saidapertures is selected from the group consisting of a circle, square,rectangle, ellipse, or polygon.
 8. The assembly aid of claim 1, whereinsaid first surface is substantially adhesive.
 9. The assembly aid ofclaim 1, wherein said second surface is substantially adhesive.
 10. Theassembly aid of claim 1, wherein said first surface includes a visualguide to assist in orienting the integrated circuit device duringassembly.